Low-power and Radiation Hardened TSPC Registers

dc.contributor.advisorSachdev, Manoj
dc.contributor.authorMaheshwari, Yugal
dc.date.accessioned2025-03-19T14:11:52Z
dc.date.available2025-03-19T14:11:52Z
dc.date.issued2025-03-19
dc.date.submitted2025
dc.description.abstractBattery-operated systems require power and energy-efficient circuits to extend their battery life. Flip-flops (FFs) are a basic component of digital circuits, and their power consumption and speed significantly impact the overall performance of a digital system. A clock network in a complex System-on-Chip (SoC) consumes a substantial amount of power. Additionally, often pipelines are used to enhance the system throughput, which puts additional burden on the clock network. Arguably, a flip-flop with fewer clock transistors will reduce its power burden on the clock network. This research proposes three very low-power Single-edge Triggered (SET) True Single-phase Clock (TSPC) FFs with only two and three clock transistors. Moreover, a scan-chain of 256 FFs and AES-128 encryption engine were designed as a benchmark to further investigate the power savings of the proposed FFs. Additionally, we have also designed three very low-power Dual-edge Triggered (DET) latch-multiplexer type TSPC FFs with only eight and ten clock transistors to sample the data at both positive and negative clock edges. Furthermore, high-performance computations in Integrated Circuits (ICs) are increasingly needed for space and safety-critical applications. ICs are subjected to high-energy ionizing particles in the radiant space environment, which will cause the device performance to degrade or even fail. A Single Event Upset (SEU) occurs in the logic circuit when an ion strikes a device’s sensitive node, changing the output from 0 to 1 or from 1 to 0. In radiant applications, ICs contain storage cells like FFs, latches, or Static Random Access Memories (SRAM), and always experience SEU. Although package and process engineering can minimize alpha particles, cosmic neutrons cannot be physically blocked. Therefore, for high reliability systems, soft error tolerant circuit designs are crucial. Traditional Radiation Hardened By Design (RHBD) techniques have some trade-offs between area, speed, power, and energy consumption. Thus, new designs are required to reduce these penalties. This research proposes two high-performance, low-power, low-energy, and low-area RHBD TSPC FFs with only four and five clock transistors suitable for space and safety-critical applications.
dc.identifier.urihttps://hdl.handle.net/10012/21507
dc.language.isoen
dc.pendingfalse
dc.publisherUniversity of Waterlooen
dc.subjectLow-power
dc.subjectTSPC
dc.subjectFlip-flops
dc.subjectRadiation Hardened
dc.subjectDual Edge Triggered Flip-fop
dc.titleLow-power and Radiation Hardened TSPC Registers
dc.typeDoctoral Thesis
uws-etd.degreeDoctor of Philosophy
uws-etd.degree.departmentElectrical and Computer Engineering
uws-etd.degree.disciplineElectrical and Computer Engineering
uws-etd.degree.grantorUniversity of Waterlooen
uws-etd.embargo.terms1 year
uws.contributor.advisorSachdev, Manoj
uws.contributor.affiliation1Faculty of Engineering
uws.peerReviewStatusUnrevieweden
uws.published.cityWaterlooen
uws.published.countryCanadaen
uws.published.provinceOntarioen
uws.scholarLevelGraduateen
uws.typeOfResourceTexten

Files

Original bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
Maheshwari_Yugal.pdf.pdf
Size:
26.91 MB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
6.4 KB
Format:
Item-specific license agreed upon to submission
Description: